Code: TOH	Time Slot/Poster Number: 4:00 - 4:30 pm	Session: Tip-Enhanced and Near-Field Raman I
Probe and Instrument Development for Tip Enhanced Raman Scattering & Shadow Near-Field Scanning Optical Microscopy
Aaron Lewis
The Hebrew University of Jerusalem, Jerusalem, Israel
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Summary
Research will be described that has focused on optimizing the essential components of instrumentation and probes for tip enhanced Raman scattering (TERS) and associated techniques based on full integration of scanned probe microscopy with microRaman spectroscopy. The results of this research effort have allowed for a general TERS solution that can be applied for both opaque and transparent samples. It also permits for integration with all upright, inverted and dual 4 Pi microscope solutions.

Code: TOH	Time Slot/Poster Number: 4:30 - 5:00 pm	Session: Tip-Enhanced and Near-Field Raman I
Near-field Raman Microscopy and Spectroscopy of Carbon Nanotubes
Lukas Novotny1; Gustavo Cancado2; Ado Jorio2; Achim Hartschuh3
1University of Rochester, Rochester, NY; 2Universidade Federal de Minas Gerais, Belo Horizonte, Brazil; 3Ludwig-Maximilians-Universitat Muenchen, Muenchen, Germany
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Summary
We use a laser-irradiated optical antenna, such as a metal tip, to establish a localized optical interaction with a sample surface. A hyperspectral image of the sample surface is recorded by raster-scanning the antenna over the sample surface and acquiring a Raman scattering spectrum pixel-by-pixel. We apply this type of near-field spectroscopy to map out phonons and excitons in single-walled carbon nanotubes with a resolution of 10nm. The method is able to resolve defects in the tube structure as well as interactions with the local environment. We observe that defects lead to a band renormalization and to trapping of excitons.

Code: TOH	Time Slot/Poster Number: 5:00 - 5:30 pm	Session: Tip-Enhanced and Near-Field Raman I
Tip-pressurized near-field Raman microscopy: a breakthrough towards molecular resolution
Satoshi Kawata; Prabhat Verma; Takaaki Yano
Osaka University, Toyonaka, Osaka, Japan
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Summary
Raman microscopy achieves new and exciting aspects when it is combined with the near-field techniques, as it goes beyond the limits of conventional optical microscopy, in terms of both the spatial resolution and scattering intensity.

Code: TOH	Time Slot/Poster Number: 5:30 - 5:50 pm	Session: Tip-Enhanced and Near-Field Raman I
Raman Spectroscopy of Single Semiconductor Nanowires: From Confocal Microscopy to TERS
François Lagugné-Labarthet1; David Talaga2
1University of Western Ontario, London, Canada; 2Université Bordeaux 1, Talence, France
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Summary
Probing the vibrational signature of nanomaterials with a spatial resolution in the range of 10-100 nm is of tremendous interest to understand the properties of nanoscale materials due to possible confinement effects.Surpassing the resolution limit of conventional optical microscopy by a combination of scanning near-field techniques with confocal microscopy is a challenge that presents many advantages in terms of spatial resolution and acquisition time improvements. We report the study of one-dimensional semiconductor-nanowires of gallium nitride (GaN) and silicon (Si). The dimensions of the wires vary between 90 nm to 200 nm in diameter and several microns in length.

Code: TOH	Time Slot/Poster Number: 5:50 - 6:10 pm	Session: Tip-Enhanced and Near-Field Raman I
Near-Field CARS with Micro- and Nano-Particle
Raymond Ooi
University of Malaya, Kuala Lumpur, Malaysia
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Summary
Spatial dependence of coherent anti-Stokes Raman scattering (CARS) intensity and spectra for a spherical particle are studied for different sizes, ranging from micrometers to nanometers. Effects of near field on the spectra are analyzed, showing potential application as nano-sensor in microscopy and imaging. The results can be extended to an array of nanospheres.