Providing non-destructive in situ pigment identification, Raman microscopy is a nearly ideal tool for the analysis of works of art. Although Raman microscopy can give a wealth of information, it has limitations, the most notable being interference from fluorescent species, lack of elemental information, and the inability to probe subsurface layers. Furthermore, being a point analysis technique, the time required to map large areas is prohibitively long. Examples illustrating how these shortcomings can be overcome – or even used to advantage – through the use of complementary techniques such as XRF, XRD, FTIR, ICP-MS and multispectral imaging will be presented.
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